AFI Electronics
  • Comments
  • Immutable Page
  • Menu
    • Navigation
    • RecentChanges
    • FindPage
    • Local Site Map
    • Help
    • HelpContents
    • HelpOnMoinWikiSyntax
    • Display
    • Attachments
    • Info
    • Raw Text
    • Print View
    • Edit
    • Load
    • Save
  • Login

Navigation

  • FirstPage
  • ADC
  • TDC
  • Logical
  • Interfaces
  • Systems
  • Documentation
  • Contacts
  • PrivatePage
  • RecentChanges
PCI Digitizer, VME TDC, PCI VME Master, Data Acquisition System

Upload page content

You can upload content for the page named below. If you change the page name, you can also upload content for another page. If the page name is empty, we derive the page name from the file name.

File to load page content from
Page name
Comment

  • ADC Pattern Test

ADC Pattern Test

  • SDB Device ID 0x286e09bb

Registers

  • 0x0, Identification 286e09bb, 32 bits, RO

  • 0x2, ADC Pattern Test Control, R/W
    • [0] - test enable (resets previous results, when started new test)
    • [1] - pause test
    • [2] - PRBS test enable (resets previous results, when started new test) (since ver. 1.1)
    • [15:3] - reserved
  • 0x3, ADC Test Pattern, MSB aligned, R/W
  • 0x4~0x7, number of checked ADC words, 64 bits, RO
  • 0x8~0xF, Mask of failed channels, 128 bits, RO
    • Bit number == channel number, set if ADC word not equal to test pattern


SDB